b'Figure 5. Defects verification from FIB characterization of Sample 2Sample 2. As shown in Figures 4 andthe 3D tomography data. The 5, multi-scale Backscattered Electrondefects were detected using image images were collected to confirm theprocessing techniques, and results leaking cracks existing on Samplewere shown in Figure 6. Figure 1 and Sample 2. Moreover, radial,6(e) shows the rendering result of circumferential, and secondary cracksthe defects. In this TEM region, were observed from the two samples.the volume porosity fraction was determined to be 5.83 vol %, and High Resolution TEMthe primary crack size was found Characterization to be 4.34m2.41m0.29m. A 3D STEM tomography was usedsecondary crack was also observed.to characterize nano-porosity and microcracks. One TEM sample (3.26m3.26m0.32m) was lifted out from Sample 1 and 3D STEM data was generated using Avizo software. The 3D STEM data was collected from in-situ TEM sample with tilting -50 degree to 50 degree. After acquiring the images, aligning and reconstruc-tion steps were utilized to obtain Figure 6. TEM Sample 3D tomography2023|AFC ACCOMPLISHMENTS 61'