b'Figure 1. (a) Scanning Electron Microscopy (SEM) overview of a Transmission Electron Microscopy (TEM) grid femtosecond laser cut from a Physical Vapor Deposited (PVD) Cu foil. An inset of the thinned TEM region is marked by a dashed box. (b) Low magnification TEM image of one thinned region, with boxes labelled c and d corresponding to the respective high magnification images.2020|AFC ACCOMPLISHMENTS 75'